Электронный ресурс (аналит. описание)

Shcherban, I. M.
Features of the USE of microwave microscopy in nanoelectronics technology [Электронный ресурс] / I. M. Shcherban, Y. Y. Gordienko // Functional basis of nanoelectronics : coll. of sci. works [of the] X Intern. sci. conf. (Sept. 16-21, Kharkiv, 2019) / National acad. of sciences of Ukraine, Inst. for scintillation materials [et al.]. – Текст. дані. – Kharkiv; Odesa, 2019. – P. 55-58.